- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 21/88 - Investigating the presence of flaws, defects or contamination
Patent holdings for IPC class G01N 21/88
Total number of patents in this class: 5788
10-year publication summary
|
349
|
391
|
486
|
525
|
622
|
650
|
630
|
601
|
539
|
208
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| KLA-Tencor Corporation | 2574 |
283 |
| KLA Corporation | 1223 |
194 |
| FUJIFILM Corporation | 27102 |
86 |
| Hitachi High-Tech Corporation | 4424 |
81 |
| Omron Corporation | 6968 |
75 |
| ASML Netherlands B.V. | 6816 |
70 |
| The Boeing Company | 19843 |
66 |
| Samsung Electronics Co., Ltd. | 131630 |
60 |
| Panasonic Intellectual Property Management Co., Ltd. | 27812 |
56 |
| NEC Corporation | 32703 |
52 |
| Koh Young Technology Inc. | 332 |
49 |
| LG Energy Solution, Ltd. | 10813 |
36 |
| Canon Inc. | 36841 |
35 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
35 |
| Boe Technology Group Co., Ltd. | 35384 |
34 |
| Applied Materials Israel, Ltd. | 549 |
33 |
| General Electric Company | 18133 |
31 |
| KEYENCE Corporation | 372 |
31 |
| Screen Holdings Co., Ltd. | 2431 |
31 |
| Tokyo Electron Limited | 11599 |
28 |
| Other owners | 4422 |